DesignCon 2010 Power Integrity and Noise Coupling Effects on Signal Integrity – Methodology for Identifying the Deterministic Jitter Components and their Generating Sources in Data Communication Systems
نویسنده
چکیده
منابع مشابه
Connectivity as a Measure of Power System Integrity
Measures of network structural integrity useful in the analysis and synthesis of power systems are discussed. Signal flow methodology is applied to derive an expression for the paths between sources and sinks in a power network. Connectivity and reach ability properties of the network are obtained using the minors of a modified connectivity matrix. Node-connectivity, branch connectivity and mix...
متن کاملDesignCon 2011 Worst - Case Patterns for High - Speed Simulation and Measurement
Design and validation of high speed serial link at multi Gbps requires time-domain simulation and measurement. The pattern length for transistor level simulation is limited to a few hundred bits due to the practical simulation time while the pattern length for oscilloscope measurement is limited to a few hundred to a few thousand of bits due to the record length. This is where and why " killer ...
متن کاملDesignCon 2011 On-Chip Characterization of Signal and Power Integrity in 3-D Packaged Systems
Characterization of I/O channels, signal quality, and supply noise in 3-D packaged systems is very challenging due to the small footprint and complex 3-D interaction. This paper presents several enabling techniques to allow on-chip signal and power integrity characterization for the 3-D packaged systems. They provide comprehensive in-situ characterization capabilities for measuring overall link...
متن کاملDESIGNCON 2009 SSO Noise, Eye Margin, and Jitter Characterization for I/O Power Integrity
In this paper, we describe the Power Integrity design and characterization for a single ended I/O interface through noise, EYE margin, and jitter measurements. The frequency domain techniques are used for designing the I/O PDN. For PDN characterization, onchip PDN elements are extracted through the VNA measurements. The peak to peak voltage noise is measured on-chip at the driver. The Eye margi...
متن کاملTesting at MultiGbps Rates
302 0740-7475/04/$20.00 © 2004 IEEE Copublished by the IEEE CS and the IEEE CASS IEEE Design & Test of Computers THE RECENT DEPLOYMENT of gigabit-per-second (Gbps) serial I/O interconnects aims at overcoming data transfer bottlenecks resulting from the limited ability to increase chip pin counts in parallel bus architectures. Gigabit-per-second data rates in today’s asynchronous I/O interconnec...
متن کامل